Probe Position Analysis Scanner/Semi-Automatic Adjuster (PSX-110M)
- Applicable to Cantilever, Cobra, MEMS, and Pogo pin types.
- Suitable for square/circular pointed probes, and square/circular flat-tipped probes.
- Detects defects such as oxidation, missing corners, melting gaps, missing probes, misalignment, and coplanarity.
- Only five minutes are required for the inspection of fifty thousand probe points.
- Supports composite probe detection function.
- Features a defect probe positioning and inquiry system.
- Displays the distribution of defect probe classifications.
- Provides a comfortable, fast, and efficient environment for probe inspection operations.
- Needle inspection auxiliary system.
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