Probe Position Analysis Scanner/Semi-Automatic Adjuster (PSX-110M)

Probe Position Analysis Scanner/Semi-Automatic Adjuster (PSX-110M)

  • Applicable to Cantilever, Cobra, MEMS, and Pogo pin types.
  • Suitable for square/circular pointed probes, and square/circular flat-tipped probes.
  • Detects defects such as oxidation, missing corners, melting gaps, missing probes, misalignment, and coplanarity.
  • Only five minutes are required for the inspection of fifty thousand probe points.
  • Supports composite probe detection function.
  • Features a defect probe positioning and inquiry system.
  • Displays the distribution of defect probe classifications.
  • Provides a comfortable, fast, and efficient environment for probe inspection operations.
  • Needle inspection auxiliary system.
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