Glttek

Probe Position Analysis Scanner/Automatic Adjuster (PSX-110A)

Probe Position Analysis Scanner/Automatic Adjuster (PSX-110A)
 

 
  • Applicable to Cobra, MEMS, and Pogo pin types.
  • Suitable for square/circular pointed probes, and square/circular flat-tipped probes.
  • Detects defects such as oxidation, missing corners, melting gaps, missing probes, misalignment, coplanarity, etc.
  • The inspection time for fifty thousand probe points is only five minutes.
  • Supports composite probe detection function.
  • Features a defect probe positioning and inquiry system.
  • Displays the distribution of defect probe classifications.
  • Efficient automatic probe adjustment assistance system.
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